Apparatus for surface inspection and method and apparatus for inspecting substrate
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United States of America Patent
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Mar 17, 2009
Grant Date -
Sep 1, 2005
app pub date -
Feb 11, 2005
filing date -
Feb 27, 2004
priority date (Note) -
Expired
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Abstract
A target object has its surface condition inspected by having its image taken from above while being irradiated by red, green and blue light beams at different elevation angles. An inspection area is set on the image and a direction is extracted on the image in which a change appears in the color phase according to the arrangement of the light sources and this extracted direction is compared with a preliminarily registered standard direction to judge the surface condition from the result of this comparison.
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