Device and method for inspecting for flaw on surface of work

United States of America Patent

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Mar 3, 2009
Grant Date
Feb 7, 2008
app pub date
Aug 25, 2005
filing date
Sep 3, 2004

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Abstract

extracts high frequency waveform components from the obtained waveform data, and detects flaws on the inspection region based on the high frequency waveform components.

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Patent Owner(s)

Patent Owner	Address
KOMATSU NTC LTD	100 FUKUNO NANTO-SHI TOYAMA 939-1595

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G01B:MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIME....

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Inventor Name	Address	# of filed Patents	Total Citations
Yamamoto, Makoto	Komatsu , JP	297	3169
Yoshimoto, Akihiro	Komatsu, JP	22	96

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Device and method for inspecting for flaw on surface of work

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United States of America Patent

11659737

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PATENT NO	7499813
APP PUB NO	20080033664A1
SERIAL NO	11659737
DOCKET NO

US Family Size	Non-US Coverage
Patent Longevity Expired	Forward Citations

DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
March 03, 2009	US,7499813,B2 US7499813B2	GRANTED PATENT AS SECOND PUBLICATION
February 07, 2008	US,20080033664,A1 US20080033664A1	FIRST PUBLISHED PATENT APPLICATION

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11659737

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