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• 15 United States
• 10 France
• 8 Japan
• 7 China
• 5 Korea
• 2 Other

Patent Owner(s)

Patent Owner	Address
STELLA CHEMIFA CORPORATION	OSAKA-SHI OSAKA 541-0044

International Classification(s)

• C09K:MATERIALS FOR APPLICATIONS NOT OTHERWISE PROVIDED ....
• G01T:MEASUREMENT OF NUCLEAR OR X-RADIATION

• [Classification Symbol]

• [Patents Count]

Inventor(s)

Inventor Name	Address	# of filed Patents	Total Citations
Fukuda, Tsuguo	Sendai, JP	51	573
Kikuyama, Hirohisa	Izumiootsu, JP	45	501
Koike, Hikaru	Yamanshi, JP	1	4
Satonaga, Tomohiko	Izumiootsu, JP	8	31

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Maintenance Fees

Fee	Large entity fee	small entity fee	micro entity fee	due date

Fee	Large entity fee	small entity fee	micro entity fee
Surcharge after expiration - Late payment is unavoidable	$700.00	$350.00	$175.00
Surcharge after expiration - Late payment is unintentional	$1,640.00	$820.00	$410.00

DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
March 03, 2009	US,7498579,B2   US7498579B2	GRANTED PATENT AS SECOND PUBLICATION
January 25, 2007	US,20070018107,A1   US20070018107A1	FIRST PUBLISHED PATENT APPLICATION

Full Text

US Patent No: 7498579

Scintillator and radiation detector, and radiation inspecting device

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