Method and device for enabling the measurement of device under test voltages using a testing instrument of limited range
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United States of America Patent
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Feb 17, 2009
Grant Date -
N/A
app pub date -
May 31, 2006
filing date -
May 31, 2006
priority date (Note) -
Expired
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Abstract
A method for determining an output voltage of a device under test is disclosed. In the method, a first voltage is placed onto a terminal of a resister that is coupled to the device under test and a first current is through the resistor that corresponds to the first voltage is measured. A second voltage is then placed onto the terminal of the resistor and a second current is measured through the resistor that corresponds to the second voltage. An actual resistance of the resistor is computed based on the difference between the first voltage and the second voltage divided by the difference between the first current and the second current. An output voltage of the device under test is calculated based on a magnitude of a measured current through the resistor when the terminal is grounded multiplied by a magnitude of the actual resistance of the resistor.
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