Inspection equipment of circuit board and inspection method of circuit board

United States of America Patent

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Feb 10, 2009
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Mar 6, 2008
app pub date
Jul 14, 2005
filing date
Jul 15, 2004

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Abstract

An apparatus and method for inspecting a circuit board is described which can well absorb a variation in a height of an electrode to be inspected and can maintain an insulating property between adjacent inspection electrodes even if the electrode to be inspected is arranged at a fine pitch.

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Patent Owner(s)

Patent Owner	Address
ISC CO LTD	26 GEUMTO-RO 40BEON-GIL SUJEONG-GU SEONGNAM-SI GYEONGGI-DO 13217 13217

International Classification(s)

G01R:MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC V....

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Inventor Name	Address	# of filed Patents	Total Citations
Hara, Fujio	Hidaka, JP	16	104
Kimura, Kiyoshi	Hidaka, JP	203	2432
Shimoda, Sugiro	Hidaka, JP	10	84
Suzuki, Satoshi	Hidaka, JP	709	8720

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Inspection equipment of circuit board and inspection method of circuit board

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United States of America Patent

11632287

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PATENT NO	7489147
APP PUB NO	20080054921A1
SERIAL NO	11632287
DOCKET NO

US Family Size	Non-US Coverage
Patent Longevity Expired	Forward Citations

DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
February 10, 2009	US,7489147,B2 US7489147B2	GRANTED PATENT AS SECOND PUBLICATION
March 06, 2008	US,20080054921,A1 US20080054921A1	FIRST PUBLISHED PATENT APPLICATION

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11632287

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