Method for chemical vapor deposition capable of preventing contamination and enhancing film growth rate

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United States of America Patent

PATENT NO 7485339
APP PUB NO 20070065599A1
SERIAL NO

11602523

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Abstract

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A method for chemical vapor deposition (CVD) comprises injecting a purge gas into a reaction chamber where substrates are located; and supplying a source material of vapor phase participating directly in forming a film on the substrates to an inside of the reaction chamber, thus forming a protective curtain in the inside of the reaction chamber by a mutual diffusion-suppressing action between the purge gas and source material.

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Patent Owner(s)

Patent OwnerAddress
KOREA INSTITUTE OF INDUSTRIAL TECHNOLOGY89 YANGDAEGIRO-GIL IPJANG-MYEON SEOBUK-GU CHEONAN-SI CHUNGCHEONGNAM-DO 331-820
PIEZONICS CO LTD35-3 HONGCHEON-RI IPJANG-MYEON SEOBUK-GU CHEONAN-SI CHUNGCHEONGNAM-DO 331-825

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Byun, Chulsoo 2-709 Seorin Apt. 869 Dogok-1-dong 3 472

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