Method for estimating at least one component placement position on a substrate as well as a device for carrying out such a method
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United States of America Patent
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Jan 6, 2009
Grant Date -
Sep 29, 2005
app pub date -
Feb 11, 2005
filing date -
Feb 13, 2004
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A method and a device are provided for estimating at least one component placement position on a substrate at which a component is to be placed. The component placement position is estimated on the basis of the position of at least one mark on the substrate. The statistical measurement inaccuracies of the marks are determined. Subsequently, the positional accuracy of the component placement position on the substrate is estimated on the basis of the measurement inaccuracies of the marks. Subsequently, the estimated positional accuracy of the component placement position is compared with a desired positional accuracy. Subsequently, a determination is made regarding whether the component is to be placed on the substrate with the estimated positional accuracy of the component placement position.
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