Semiconductor integrated circuit tester with interchangeable tester module
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United States of America Patent
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Dec 30, 2008
Grant Date -
Mar 13, 2008
app pub date -
Nov 5, 2007
filing date -
Oct 25, 2005
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A test head for an integrated circuit tester includes a main chassis defining a chamber that is open at the top. Tester modules are installed in the chamber, each tester module being removable as a unit from the chamber and including a tester module chassis, multiple pin electronics cards, and a tester module interface structure exposed at the top of the chamber. A test head interface structure is engageable with the tester module interface structures of the tester modules for connecting the tester module interface structures to a device interface unit.
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