Jitter measurement method, jitter measuring apparatus and image forming apparatus
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United States of America Patent
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Dec 23, 2008
Grant Date -
Feb 9, 2006
app pub date -
Aug 1, 2005
filing date -
Aug 3, 2004
priority date (Note) -
Expired
status (Latency Note)
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Abstract
The present invention measures jitter in a galvano scanner that scans a light beam on a surface to be scanned by periodically turning a reflection mirror in a reciprocating manner. Two detectors for detecting and receiving the light beam are mounted near both ends of the scan region of the light beam, a first detection signal of each of the two detectors is extracted whenever the reflection mirror is activated for one scanning, a required time for one scanning is computed from the extracted detection signals, and a variation in the required time for each scanning is measured based on the computed required time.
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