Sensor system for measuring an electric potential signal of an object
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United States of America Patent
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Dec 16, 2008
Grant Date -
Jun 14, 2007
app pub date -
Jul 1, 2005
filing date -
Jul 1, 2004
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Abstract
The invention generally pertains to reducing artifact noise signals present when non-invasive capacitive-type signal measurements are taken of static electric fields produced by an object of interest. According to a first preferred embodiment of the invention, a given static artifact signal is reduced by minimizing the potential difference between a ground point of sensor circuitry and the potential of the object. According to a second preferred embodiment of the invention, the change in signal due to motion of the sensor in the field produced by the object is minimized by reducing the impact of changes in coupling to the signal source.
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