Beam alignment in spectroscopic microscopes
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United States of America Patent
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Dec 2, 2008
Grant Date -
Jul 19, 2007
app pub date -
Jan 13, 2006
filing date -
Jan 13, 2006
priority date (Note) -
Expired
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Abstract
A spectroscopic microscope includes a laser or other light source which emits light from the entrance aperture of its spectrograph, and also includes a light sensor situated on the microscope sample stage upon which a specimen is to be situated for microscopic/spectrometric analysis. The sample stage is positioned such that the signal from the light sensor is maximized, thereby indicating good alignment between the sample stage and spectrograph. Additionally, the microscope sample stage bears a light source which can emit light to be detected by a light sensor situated at the vantage point of a user/viewer utilizing the microscope, and such a light sensor can simply take the form of a video camera or other image recordation unit associated with the microscope. The sample stage can also be positioned to optimize the signal at the light sensor to signify good alignment between the sample stage and the microscope.
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