Impedance measurement system with incorporated internal measurement drift compensation networks
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Dec 2, 2008
Grant Date -
Mar 15, 2007
app pub date -
Sep 9, 2005
filing date -
Sep 9, 2005
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
The present technology provides an Impedance Measurement System (ZMS) for measuring the complex impedance of each well of a single well or multiwell microtiter plate utilizing a novel combination of parallel impedance measurement channels, multiplexing, and reference impedance networks, allowing internal correction of impedance measurement drift, maximized measurement accuracy, and minimized system size.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully