Deconvolving far-field images using scanned probe data
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United States of America Patent
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Nov 11, 2008
Grant Date -
Sep 1, 2005
app pub date -
May 2, 2005
filing date -
Feb 14, 1999
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Abstract
A method for deconvolving far-field optical images beyond the diffraction limit includes the use of near-field optical and other scanned probe imaging data to provide powerful and new constraints for the deconvolution of far-field data sets. Near-field data, such as that which can be obtained from atomic force microscopy on a region of the far-field data set in an integrated and inter-digitate way, is used to produce resolutions beyond the diffraction limit of the lens that is being used. In the case of non-linear optical imaging or other microscopies, resolutions beyond that which is achievable with these microscopies can be obtained.
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