Scanning thermal probe microscope

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 7448798
SERIAL NO

10464379

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An apparatus and method of measuring a parameter associated with a sample is provided. The method includes providing a probe adapted to heat the sample and applying a measuring current having a frequency .omega..sub.1 to the probe. In operation, the method measures the amplitude of the voltage across the probe at a frequency .omega..sub.1. This amplitude is indicative of a temperature of the probe. The preferred embodiment also provides a method of separating contamination of the thermal data caused by the probe from thermal data associated with the sample under test.

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Patent Owner(s)

Patent OwnerAddress
BRUKER NANO INC112 ROBIN HILL ROAD SANTA BARBARA CA 93117

International Classification(s)

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  • 2003 Application Filing Year
  • G01K Class
  • 322 Applications Filed
  • 142 Patents Issued To-Date
  • 44.10 % Issued To-Date
Click to zoom InYear of Issuance% of Matters IssuedCumulative IssuancesYearly Issuances200320042005200620072008200920102011201220130255075100

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Wang, Chunhai Sunnyvale, CA 13 51

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Patent Citation Ranking

  • 24 Citation Count
  • G01K Class
  • 74.73 % this patent is cited more than
  • 17 Age
Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges2392710623201 - 1011 - 2021 - 3031 - 4041 - 5051 - 60100 +02.557.51012.51517.52022.52527.53032.53537.54042.5

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