Scanning thermal probe microscope
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
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Nov 11, 2008
Grant Date -
N/A
app pub date -
Jun 18, 2003
filing date -
Jun 18, 2003
priority date (Note) -
Expired
status (Latency Note)
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Abstract
An apparatus and method of measuring a parameter associated with a sample is provided. The method includes providing a probe adapted to heat the sample and applying a measuring current having a frequency .omega..sub.1 to the probe. In operation, the method measures the amplitude of the voltage across the probe at a frequency .omega..sub.1. This amplitude is indicative of a temperature of the probe. The preferred embodiment also provides a method of separating contamination of the thermal data caused by the probe from thermal data associated with the sample under test.
First Claim
all claims..Other Claims data not available
Family

- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
Patent Owner | Address | |
---|---|---|
BRUKER NANO INC | 112 ROBIN HILL ROAD SANTA BARBARA CA 93117 |
International Classification(s)

- 2003 Application Filing Year
- G01K Class
- 322 Applications Filed
- 142 Patents Issued To-Date
- 44.10 % Issued To-Date
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
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Wang, Chunhai | Sunnyvale, CA | 13 | 51 |
# of filed Patents : 13 Total Citations : 51 |
Cited Art Landscape
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Patent Citation Ranking
- 24 Citation Count
- G01K Class
- 74.73 % this patent is cited more than
- 17 Age
Forward Cite Landscape
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Maintenance Fees
Fee | Large entity fee | small entity fee | micro entity fee | due date |
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Fee | Large entity fee | small entity fee | micro entity fee |
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Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
Surcharge after expiration - Late payment is unintentional | $1,640.00 | $820.00 | $410.00 |
Full Text

Legal Events
Date | Code | Event | Description |
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Dec 23, 2009 | AS | ASSIGNMENT | free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:MICRON TECHNOLOGY, INC.;REEL/FRAME:023786/0416 Owner name: ROUND ROCK RESEARCH, LLC,NEW YORK Effective Date: Dec 23, 2009 free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:MICRON TECHNOLOGY, INC.;REEL/FRAME:023786/0416 Owner name: ROUND ROCK RESEARCH, LLC, NEW YORK Effective Date: Dec 23, 2009 |
Oct 14, 2009 | FPAY | FEE PAYMENT | year of fee payment: 12 |
Oct 24, 2005 | FPAY | FEE PAYMENT | year of fee payment: 8 |
Sep 27, 2001 | FPAY | FEE PAYMENT | year of fee payment: 4 |
May 12, 1998 | I | Issuance | |
Apr 30, 1998 | STCF | INFORMATION ON STATUS: PATENT GRANT | free format text: PATENTED CASE |
Dec 05, 1997 | FEPP | FEE PAYMENT PROCEDURE | free format text: PAYOR NUMBER ASSIGNED (ORIGINAL EVENT CODE: ASPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY |
Sep 27, 1995 | AS | ASSIGNMENT | free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:WOLSTENHOLME, GRAHAM R.;IRELAND, PHILIP J.;REEL/FRAME:007713/0737;SIGNING DATES FROM 19950814 TO 19950908 Owner name: MICRON TECHNOLOGY, INC., IDAHO |
Jun 07, 1995 | F | Filing | |
Jun 07, 1995 | PD | Priority Date |

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