Ion beam device

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 7435976
APP PUB NO 20070114455A1
SERIAL NO

10581429

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An ion beam apparatus comprises an ion source 2 which extracts an ion beam 4, a mass separation electromagnet 6 which separates an ion beam 4 of desired mass from the ion beam 4 extracted from the ion source 2, a scanner 12 which scans the injected ion beam 4 with a given scan center as center within a given scan surface, an electrostatic deflector 30 which deflects the ion beam through 90.degree. so that an ion beam of desired energy in said ion beam travels in a direction perpendicular to said scan surface within a circular-arc-shaped deflection zone centered on the scan center, and a scanning mechanism 54 which retains a target 50 and which mechanically, reciprocally moves the target 54 in a direction in which the target crosses the ion beam passed from the electrostatic deflector 30 at a given angle.

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Patent Owner(s)

Patent OwnerAddress
NISSIN ION EQUIPMENT CO LTDMINAKUCHI-CHO KOKA-CITY SHIGA 528-0068

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Fujita, Hideki Kyoto, JP 50 305
Naito, Masao Kyoto, JP 17 240

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  • 7 Citation Count
  • H01J Class
  • 4.74 % this patent is cited more than
  • 17 Age
Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges47546202843723228458601 - 1011 - 2021 - 3031 - 4041 - 5051 - 6061 - 7071 - 8081 - 9091 - 100100 +0255075100125150175200225250275300325350375400425450475500525550575

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