Method and system for non-destructive evaluation of conducting structures
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United States of America Patent
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Sep 23, 2008
Grant Date -
Sep 27, 2007
app pub date -
May 17, 2007
filing date -
Jun 7, 2004
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Abstract
Method and system for non-destructive evaluation for a conducting structure by measuring the electrical impulse response thereof including applying a PRBS test input signal to the conducting structure, detecting an output signal from the conducting structure and processing the data to assess the condition of the conducting structure via changes in the electrical impulse response and to locate any defects along the conducting structure.
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