Interferometric optical analyzer and method for measuring the linear response of an optical component

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United States of America Patent

PATENT NO 7426021
APP PUB NO 20060114471A1
SERIAL NO

11287972

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Abstract

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An interferometric optical analyzer apparatus comprises a light source, an interferometer and a detection system for determining the linear response, and subsequently any optical parameter, of one or more optical elements using substantially unpolarized light. In one embodiment, the light source supplies substantially unpolarized coherent light over a predetermined range of optical frequencies. The optical element is coupled in one arm of the interferometer and the other arm of the interferometer is used as a reference. The unpolarized light is first passed through the interferometer then through a three-way polarization splitter unit to split the light into at least three light beams according to preselected polarization axes corresponding to three linearly independent states of polarization. The three light beams are coupled to individual detectors and a controller computes Jones matrix elements from the resulting electrical signals. The total polarization independent power may also be determined by an additional detector.

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Patent Owner(s)

Patent OwnerAddress
EXFO ELECTRO-OPTICAL ENGINEERING INCQUEBEC CAN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Cyr, Normand Sainte-Foy, CA 21 249

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