Cantilever array, method for fabricating the same, scanning probe microscope, sliding apparatus of guiding and rotating mechanism, sensor, homodyne laser interferometer, laser doppler interferometer having optically exciting function for exciting sample, each using the same, and method for exciting cantilevers

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United States of America Patent

PATENT NO 7411189
APP PUB NO 20070018096A1
SERIAL NO

11454987

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Abstract

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A cantilever array having a simple structure and being able to reliably detect a surface of a sample, a method for fabricating the same, a scanning probe microscope, a sliding apparatus of a guiding and rotating mechanism, a sensor, a homodyne laser interferometer, a laser Doppler interferometer having an optically exciting function for exciting a sample, each using the same, and a method for exciting cantilevers. The cantilever array includes a large number of compliant cantilevers sliding on a surface of a sample.

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Patent OwnerAddress
FOUNDATION FOR THE PROMOTION OF INDUSTRIAL SCIENCE THE4-6-1 KOMABA MEGURO-KU TOKYO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kawakatsu, Hideki Tokyo, JP 24 129

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