Method and testing apparatus for testing integrated circuits
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United States of America Patent
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Aug 5, 2008
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app pub date -
Feb 26, 2007
filing date -
Apr 2, 2004
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Abstract
A method for testing integrated circuits comprises: generation of a change in an input signal of the integrated circuit, detection of a change in the output signal of the integrated circuit, the change triggered by the change in the input signal when a predetermined condition is satisfied, and a comparison of the detected output signal with at least one predetermined comparison criterion. Whereby, the predetermined condition is derived individually for each integrated circuit from a time response of the output signal.
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