Detection of defects by thermographic analysis
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United States of America Patent
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Jul 22, 2008
Grant Date -
N/A
app pub date -
Aug 25, 2000
filing date -
Aug 25, 2000
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A mechanism is provided for detecting a defect in a populated sample having a thickness dimension substantially smaller than the length and width dimensions thereof, the populated sample having a first side and an opposite second side, at least said first side of said populated sample having one or more Surface Mounted Components. The mechanism exploits a standard thermographic image which may be used in a detection method comprising 1) directing a thermal wave at said second side of said populated sample 2) recording a thermographic image of the first side of said populated sample once a surface thereof reaches a predetermined transit temperature or a predetermined transit time period has elapsed; and 3) analysing the obtained thermographic image by comparing the so obtained thermographic image with a standard thermographic image.
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