Magnetic resonance force microscope

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United States of America Patent

PATENT NO 7400144
APP PUB NO 20070216412A1
SERIAL NO

11712840

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A magnetic resonance force microscope (MRFM) generator for producing an RF magnetic field uniformly over the whole of a sample. A cantilever with magnetic probe tip is self-excited. Under this condition, spins in the sample are controlled to produce a magnetic resonance force. A frequency demodulator measures the resonant frequency of the cantilever from the output detection signal from a cantilever displacement-measuring instrument based on the magnetic resonance force.

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Patent Owner(s)

Patent OwnerAddress
JEOL LTD3-1-2 MUSASHINO AKISHIMA TOKYO 196-8558
KYOTO UNIVERSITY36-1 YOSHIDA-HONMACHI SAKYO-KU KYOTO-SHI KYOTO 6068501
YOKOHAMA CITY UNIVERSITYYOKOHAMA-SHI KANAGAWA 236-0027

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kobubo, Tetsuro Kanagawa, JP 1 4
Shirakawa, Masahiro Kyoto, JP 19 104
Tsuji, Shigenori Tokyo, JP 16 19
Yoshinari, Yohsuke Tokyo, JP 2 11

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  • 3 Citation Count
  • G01V Class
  • 2.49 % this patent is cited more than
  • 17 Age
Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges713473321584231201 - 1011 - 2021 - 3031 - 4041 - 5051 - 6061 - 7071 - 8081 - 90100 +0102030405060708090100110120130140150

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