Method for quantitatively and/or qualitatively detecting layer thicknesses, a microreaction vessel and titre plate
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United States of America Patent
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Jul 8, 2008
Grant Date -
Feb 3, 2005
app pub date -
Feb 9, 2001
filing date -
Feb 11, 2000
priority date (Note) -
Expired
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Abstract
The invention relates to a method for quantitatively and/or qualitatively detecting layer thicknesses of biological or chemical molecules by means of ellipsometric measurements. Said molecules are deposited on at least one metal layer by virtue of interactions with a gaseous or liquid medium, whereby said metal layer is provided with an immobilisation layer. A method that can be carried out quickly is provided by including the surface plasmon resonance. Said method is provided with a significantly greater detection sensitivity and can be used not only for qualitatively detecting layers. According to the inventive method, the angle of incidence and/or the frequency of the electromagnetic radiation which is used for the ellipsometric measurements is/are adjusted in such a way that a surface plasmon resonance is produced in the metal layer. The detection sensitivity (.delta. cos .DELTA.)/(thickness of the layer to be detected) is adjusted by means of the thickness of the metal layer.
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