Methods and apparatus for data analysis
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United States of America Patent
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Jul 1, 2008
Grant Date -
Dec 30, 2004
app pub date -
Apr 2, 2004
filing date -
May 24, 2001
priority date (Note) -
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Abstract
A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically select one or more outlier identification algorithms for identifying statistical outliers in test data for components.
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