Apparatus and methods for the inspection of objects
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United States of America Patent
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Jun 17, 2008
Grant Date -
Jun 24, 2004
app pub date -
Nov 12, 2003
filing date -
Aug 5, 1999
priority date (Note) -
Expired
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Abstract
An electrical circuit inspection method including, for each of a plurality of types of local characteristics, each type occurring at least once within electrical circuitry to be inspected, identifying at least one portion of interest within the electrical circuitry whereat the local characteristic is expected to occur, and inspecting an image of each portion of interest, using an inspection task selected in response to the type of local characteristic expected to occur in the portion of interest.
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