Method and apparatus for wafer level testing of integrated optical waveguide circuits
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United States of America Patent
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Jun 10, 2008
Grant Date -
May 12, 2005
app pub date -
Nov 19, 2004
filing date -
Dec 28, 2001
priority date (Note) -
Expired
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Abstract
A method of testing a planar lightwave circuit is achieved by coupling an optical probe to the planar lightwave circuit. In one embodiment, a second probe is used in combination with the first probe to test the planar lightwave circuit by sending and receiving a light beam through the planar lightwave circuit.
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