Apparatus and methods for the inspection of microvias in printed circuit boards
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United States of America Patent
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May 13, 2008
Grant Date -
Mar 27, 2008
app pub date -
Sep 7, 2006
filing date -
Sep 7, 2006
priority date (Note) -
Expired
status (Latency Note)
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Abstract
An imaging method and imaging system for inspecting features located at a known inter-feature pitch on portions of a target surface. The system includes a lens array having a plurality of lenses wherein the lenses of the lens array have an inter-lens pitch and an inter-field of view pitch corresponding to the inter-feature pitch, and an array of imaging elements having an inter-element pitch corresponding to the inter-feature pitch, whereby the imaging system images only field of view areas of the target surface containing features.
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