Interface detection apparatus and method for detecting hidden interface using microwave
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United States of America Patent
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May 6, 2008
Grant Date -
Jul 21, 2005
app pub date -
Mar 31, 2004
filing date -
Jan 19, 2004
priority date (Note) -
Expired
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Abstract
An interface detection apparatus detects a position of a hidden interface between first and second materials, the first material having a different physical property from the second material. The apparatus encompasses (a) an irradiation mechanism configured to irradiate an electromagnetic wave onto a sample implemented by the first and second materials, (b) a detection mechanism configured to detect the electromagnetic wave that has passed through the sample, and (c) a traveling mechanism configured to change the relative position of the hidden interface with respect to the position of the detection mechanism.
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