Ring oscillator system
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United States of America Patent
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Apr 15, 2008
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N/A
app pub date -
May 3, 2005
filing date -
May 23, 2003
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Abstract
Testing devices at various locations on a die may be used to determine one or more properties of the locations. For example, a testing device including an oscillator such as a ring oscillator at a location may be used to determine a silicon quality, temperature, and/or voltage at the location.
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