Methods and apparatus for data analysis
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United States of America Patent
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Apr 8, 2008
Grant Date -
Dec 15, 2005
app pub date -
Feb 7, 2005
filing date -
May 24, 2001
priority date (Note) -
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Abstract
A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a component fabrication process guided by characteristics of the test data for the components. A method and apparatus according to various aspects of the present invention may operate in conjunction with a test system having a tester, such as automatic test equipment (ATE) for testing semiconductors.
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