System and method for assessing fetal abnormality based on landmarks

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United States of America Patent

PATENT NO 7343190
APP PUB NO 20050245825A1
SERIAL NO

10900292

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A method and system for assessing fetal abnormality based on landmarks. According to one embodiment, at least two coordinates are received for each of a plurality of points identifying a configuration of landmarks in a fetal image, and any of the received coordinates of any of the plurality of points are utilized as markers to assess fetal abnormality. According to another embodiment, at least two coordinates are received for each of a plurality of points identifying a configuration of landmarks in a fetal image, and one or more values resulting from a linear combination of any of the received coordinates of any of the plurality of points are utilized as markers to assess fetal abnormality.

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Patent Owner(s)

Patent OwnerAddress
NTD LABORATORIES INC403 OAKWOOD ROAD HUNTINGTON STATION NY 11746

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Krantz, David A Bayside, NY 3 153
Macri, Vincent James Oyster Bay, NY 12 127
Orlandi, Francesco Palermo, IT 4 178

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