Device and method for imaging a multiple particle beam on a substrate

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United States of America Patent

PATENT NO 7332730
APP PUB NO 20060102853A1
SERIAL NO

11270073

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A device and a method for imaging and positioning a multiparticle beam on a substrate is disclosed. The device comprises a particle beam source with a condenser optic that produces a particle beam that illuminates the surface of an aperture plate. A multiplicity of individual beams are produced from the particle beam by means of the aperture plate, which are then projected by a projection system onto a substrate where they describe a beam base point. The substrate or target, respectively, is placed on a table that is movable along an x-coordinate and a y-coordinate, and that is provided with a laser path measurement system. The laser path measurement system relays positional data with a fixed clock rate to a synchronization and control device 50 that positions the beam base point along the x-coordinate and the y-coordinate via a beam tracking system, taking into account the corrective data and pixel phase, whereby precise staircase beam-to-table positioning is achieved across the entire substrate in spite of faulty table movement.

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Patent Owner(s)

Patent OwnerAddress
VISTEC ELECTRON BEAM GMBH07743 JENA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Heinitz, Joachim Isserstedt, DE 3 208
Schubert, Andreas Niederrossla, DE 23 178

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