Process control using on-line instrumentation and process models
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Jan 15, 2008
Grant Date -
Apr 29, 2004
app pub date -
Oct 28, 2002
filing date -
Oct 28, 2002
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A method for providing improved estimates of properties of a chemical manufacturing process is disclosed. The method employs a process model that includes, or is modified by, scores or other gains obtained from the mathematical transformation of data obtained from an on-line analyzer. Chemical manufacturing processes using the method also are disclosed.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully