Multi-marker screening protocol for fetal abnormalities

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United States of America Patent

PATENT NO 7315787
APP PUB NO 20050074783A1
SERIAL NO

10679258

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A method of assessing a pregnant woman's risk of having a fetus with a fetal abnormality by determining the fetus' BPD/OFD ratio and using the BPD/OFD ratio in conjunction with one or more other screening markers for the fetal abnormality. Also provided is a method of determining whether a pregnant woman is screen-positive or screen-negative by comparing the BPD/OFD ratio of the pregnant woman's fetus to a risk cut-off level.

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Patent Owner(s)

Patent OwnerAddress
NTD LABORATORIES INC403 OAKWOOD ROAD HUNTINGTON STATION NY 11746

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Krantz, David Bayside, NY 16 431
Orlandi, Francesco Palermo, IT 4 178

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