System and method for automatic extraction of testing information from a functional specification
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United States of America Patent
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Dec 4, 2007
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app pub date -
Jan 14, 2004
filing date -
Jan 14, 2004
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Abstract
A system and method for testing a development device includes extracting multiple parameters of the development device from a product specification for the development device. The parameters being arranged in a predetermined first order. The parameters are stored in a testing data file. The testing data file can be input into a test bench system being coupled to the development device. The test bench system can test the development device.
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