Three dimensional analyzing device
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United States of America Patent
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Dec 4, 2007
Grant Date -
Dec 28, 2006
app pub date -
Apr 13, 2006
filing date -
Oct 15, 2003
priority date (Note) -
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Abstract
A three-dimensional analyzing device includes a first beam source for generating a first beam, a second beam source for generating a second beam, an optical system for spatially overlapping the first and second beams at least partly and irradiating the beams onto a specimen to three-dimensionally confine a photoactive region in a specimen, and a photo acceptance element for accepting a response light emitted from the photoactive region. Preferably, the device further includes an operation unit for calculating a correlation function of a response light in the time domain based on the output of the photo acceptance element to analyze a desired physical value of the specimen.
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