System and methods for determining nonuniformity correction parameters in detector-array imaging

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United States of America Patent

PATENT NO 7294817
APP PUB NO 20050247867A1
SERIAL NO

11122568

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An imaging system (110) for imaging a scene with a detector array (104) having an array of imaging elements is provided. The imaging system (110) includes an image estimation module (202) for generating a plurality estimates of uncorrupted images based upon a plurality of noisy images generated by the detector array (104). The imaging system (110) further includes a parameter determination module (204) for determining one or more nonuniformity correction parameters based upon the estimates of uncorrupted images.

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Patent Owner(s)

  • SIEMENS CORPORATE RESEARCH, INC.;SIEMENS ENERGY, INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Brummel, Hans-Gerd Orlando, FL 30 372
Lemieux, Dennis H Casselberry, FL 16 382
Ramesh, Visvanathan Plainsboro, NJ 53 2030
Voigt, Matthias Princeton, NJ 16 190
Zarzycki, Martin Grevenbroich, DE 1 11

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