Intelligent life testing methods and apparatus for leakage current protection
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United States of America Patent
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Sep 11, 2007
Grant Date -
Jul 19, 2007
app pub date -
Oct 26, 2006
filing date -
Dec 26, 2005
priority date (Note) -
Expired
status (Latency Note)
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Abstract
An apparatus for testing the life of a leakage current protection device having a leakage current detection circuit. In one embodiment, the apparatus a trip mechanism state generator, a fault alarm generator, a ground fault simulation unit. In operation, the ground fault simulation unit generates a simulated ground fault signal during every positive half-wave of an AC power, the simulated ground fault signal is detected by the leakage current detection circuit, the leakage current detection circuit responsively generates a signal to turn a switching device into its conductive state so as to allow a current to pass therethrough, the passed current is converted into a DC voltage in accordance with a trip mechanism state generated by the trip mechanism state generator, the fault alarm circuit receives and analyzes the DC voltage and indicates whether a fault exists in the leakage current protection device.
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