Polarization analyzer
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United States of America Patent
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Sep 4, 2007
Grant Date -
Jun 15, 2006
app pub date -
Jul 14, 2003
filing date -
Jul 13, 2002
priority date (Note) -
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Abstract
A thin polarizer array and a wavelength plate array that are composed of micro regions having different optical axis directions and wavelength characteristics and having a high extinction ratio and a low insertion loss, and a polarization analyzer using them. An array of micro periodic grooves is formed on a substrate, with the directions changed from one region to another. An alternating multilayer film formed by bias sputtering alternating a layer of high refractive index material such as Si or Ta.sub.2O.sub.5 and a layer of low refractive index material such as SiO.sub.2. By selecting a condition that each layer maintains its periodic projecting/recessed shape, an array of photonic crystal polarizer is formed. By mounting this array of photonic crystal polarizer in a photodetector array, a polarization analyzer that is small, has no movable part, has a small number of components, and enables high-precision measurement is constituted.
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