Sensor device for the examination of surfaces
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Jul 17, 2007
Grant Date -
Aug 11, 2005
app pub date -
Feb 3, 2005
filing date -
Feb 9, 2004
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A sensor device for examining the surfaces of a work piece, in particular in regard to burrs, is provided wherein said device comprises a probe shaft having a detector head with at least one inductive element, wherein said at least one inductive element couples inductively to the work piece, and wherein the at least one inductive element is constructed and arranged in such a manner that, with respect to a longitudinal axis of the probe shaft, the detector head has a field of view surrounding the probe shaft.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully