Method and system for optimizing a selection of spectral sensitivities

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United States of America Patent

PATENT NO 7236195
APP PUB NO 20030138141A1
SERIAL NO

10289495

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Abstract

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A method for optimizing a selection of spectral sensitivities for an imaging device includes determining a first set of spectral sensitivities from an initial set of spectral sensitivities based on an analysis of one of a universal measure of goodness, a .mu.-Factor, and RMS noise. A second set of spectral sensitivities is determined from the first plurality of sets of spectral sensitivities based on an analysis of a different one of the universal measure of goodness, the .mu.-Factor, and the RMS noise. The second set of spectral sensitivities is an optimized set of spectral sensitivities.

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Patent Owner(s)

Patent OwnerAddress
SONY CORPORATIONTOKYO
ROCHESTER INSTITUTE OF TECHNOLOGY145 LOMB MEMORIAL DRIVE ROCHESTER NY 14623-5603

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Katoh, Naoya Chiba, JP 57 809
Ohta, Noboru Rochester, NY 9 88
Quan, Shuxue San Jose, CA 40 766
Rosen, Mitchell Rochester, NY 6 31

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