Apparatus and method for data pattern alignment
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United States of America Patent
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Jun 12, 2007
Grant Date -
Jan 22, 2004
app pub date -
Jul 17, 2002
filing date -
Jul 17, 2002
priority date (Note) -
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status (Latency Note)
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Abstract
A digital tester includes a digital data pattern aligner. The digital data pattern aligner includes an alignment pattern source, a data shifter, and a data comparator. The alignment pattern source sends an alignment pattern to the comparator in a data stream. The comparator samples the data stream and compares the samples to a copy of the alignment pattern. The shifter shifts the data in the data stream so long as the comparator detects no match between a data stream sample and the copy of the alignment pattern. When a match is detected, the pattern source and the comparator are in alignment and other data, such as test patterns, may be sent to the comparator or associated components.
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