Ion attachment mass spectrometry apparatus

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United States of America Patent

PATENT NO 7202474
APP PUB NO 20060169888A1
SERIAL NO

11277198

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An ion attachment mass spectrometry apparatus causing positively charged metal ions to attach to molecules of a gas to be measured in an attachment region to generate attached ions and then performing mass spectrometry on the attached ions by a mass spectrometer, has a metal ion selective disassociation unit for selectively making the metal ions attached to the specific molecules in the attachment region disassociate. By making the metal ions attached to the specific molecules such as H.sub.2O disassociate, a state is formed where the metal ions are attached to only the sample gas to be measured and the reliability of measurement of the gas is improved.

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Patent Owner(s)

Patent OwnerAddress
ANELVA CORPORATION8-1 YOTSUYA 5-CHOME FUCHU-SHI TOKYO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hirano, Yoshiki Tokyo, JP 14 138
Maruyama, Harumi Tokyo, JP 8 58
Nakamura, Megumi Tokyo, JP 30 269
Shiokawa, Yoshiro Tokyo, JP 33 246

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