Device testing control
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United States of America Patent
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Mar 20, 2007
Grant Date -
Apr 14, 2005
app pub date -
Oct 14, 2003
filing date -
Oct 14, 2003
priority date (Note) -
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status (Latency Note)
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Abstract
Methods and systems for controlling device testing are disclosed. In one embodiment, the system comprises a local controller having a slave mode and a control mode, when in the control mode, the local controller to control testing of a device and to initiate one or more test instructions to be applied to the device, and when in the slave mode, to pass through a remote test instruction received from a remote controller to a tester. The system further comprises the tester, communicatively coupled to the local controller, to apply one of the one or more test instructions and the remote test instruction to the device.
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