Particle analysis system and method

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United States of America Patent

PATENT NO 7187441
SERIAL NO

09297895

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Abstract

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A system (20) and method are disclosed for the self-calibrating, on-line determination of size distribution f(x) and volume fraction .phi. of a number of particles (P) dispersed in a medium (M) by detecting one or more propagation characteristics of multiply scattered light from the particles (P). The multiply scattered light is re-emitted in response to exposure to a light source (21) configured to provide light at selected wavelengths. The determination includes calculating the isotropic scattering and absorption coefficients for the particles (P) by comparing the incident and detected light to determine a measurement corresponding to the propagation time through the scattering medium (M), and iteratively estimating the size distribution f(x) and volume fraction .phi. as a function of the coefficients for each of the wavelengths. An estimation approach based on an expected form of the distribution and the mass of the particles is also disclosed. Furthermore, techniques to determine a particle structure factor indicative of particle-to-particle interactions which vary with particle concentration and influence light scattering at high concentrations is disclosed.

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Patent Owner(s)

Patent OwnerAddress
TEXAS A&M UNIVERSITY SYSTEM THE3369 TAMU COLLEGE STATION TX 77843-3369

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Balgi, Ganesh Lebanon, IN 3 76
Jiang, Huabei Clemson, SC 11 245
Kao, Jeffrey Lake Jackson, TX 4 81
Pierce, Joseph Appleton, WI 10 128
Richter, Steven Brunswick, GA 3 88
Sevick-Muraca, Eva Lafayette, IN 9 244
Shinde, Rajesh West Lafayette, IN 19 422

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