Advanced illumination system for use in microlithography

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United States of America Patent

PATENT NO 7187430
SERIAL NO

10896022

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Abstract

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A system for microlithography comprises an illumination source; an illumination optical system including, in order from an objective side, (a) a first diffractive optical element that receives illumination from the illumination source, (b) a zoom lens, (c) a second diffractive optical element, (d) a condenser lens, (e) a relay lens, and (f) a reticle, and a projection optical system for imaging the reticle onto a substrate, wherein the system for microlithography provides a zoomable numerical aperture.

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Patent Owner(s)

Patent OwnerAddress
ASML HOLDING N VNETHERLANDS GELEEN LIMBURG

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Augustyn, Walter Monroe, CT 6 42
Coston, Scott New Milford, CT 6 38
Oskotsky, Mark Mamroneck, NY 17 758
Ryzhikov, Lev Norwalk, CT 41 720
Tsacoyeanes, James Southbury, CT 10 275

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  • 5 Citation Count
  • G03B Class
  • 5.09 % this patent is cited more than
  • 18 Age
Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges4249215872241594321301 - 1011 - 2021 - 3031 - 4041 - 5051 - 6061 - 7071 - 8081 - 9091 - 100100 +0255075100125150175200225250275300325350375400425450475500525

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