Reconstruction of non-deterministic algorithmic tester stimulus used as input to a device under test
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United States of America Patent
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Feb 20, 2007
Grant Date -
Jan 29, 2004
app pub date -
Jul 26, 2002
filing date -
Jul 26, 2002
priority date (Note) -
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Abstract
Input to a device under test (DUT) is reconstructed. For each trigger cycle of a tester in which data is to be input to the DUT stimulus, data is prepared to be placed as stimulus on pins of the DUT. Response information obtained from the DUT during a previous trigger cycle is used to construct formatting information used to adjust a value of the stimulus data. Reconstruction information sufficient to reconstruct the stimulus data is stored. The reconstruction information includes the formatting information. The reconstruction information is used to reconstruct the stimulus data placed on the pins of the device under test.
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