Method and apparatus for testing the operation of an electronic unit by simulation
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United States of America Patent
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Feb 13, 2007
Grant Date -
N/A
app pub date -
Aug 30, 2000
filing date -
Aug 31, 1999
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A simulator fitted with at least one microprocessor sends input simulation signals to a unit under test, and receives therefrom output signals in reaction thereto. The method consists in processing some of the output signals from the unit as they are issued by means of a programmable logic circuit, in storing parameter values corresponding to said processed signals, and in giving the microprocessor access to the stored parameter values at a frequency which is compatible with its own operating speed. The apparatus enables the method to be implemented. The simulator comprises at least one programmable logic circuit, e.g. of the FPGA type, that is suitable for receiving at least some of the signals output by the electronic unit.
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