Line quality characteristic evaluation system

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United States of America Patent

PATENT NO 7177599
APP PUB NO 20040179484A1
SERIAL NO

10643078

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A line quality characteristic evaluation system for estimating a line quality characteristic under an interference environment including nonlinear interference for a wireless communication system including at least one interfering wireless line, including a line quality estimating unit estimating the line quality of a wireless communication line under a nonlinear interference wireless line in an area in which wireless communication lines and interfering wireless lines are present together based on nonlinear distortion included by all wireless lines and expressed by an intercept point input level (IIP), a reception equivalent band limitation expressed by attenuation of the intercept point input level (IIP), reception side thermal noise of the wireless communication lines, and leakage power from other interfering wireless lines leaking into the reception equivalent band.

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Patent Owner(s)

Patent OwnerAddress
FUJITSU LIMITED1-1 KAMIKODANAKA 4-CHOME NAKAHARA-KU KAWASAKI-SHI KANAGAWA 211-8588
KDDI CORPORATION3-2 NISHI-SHINJUKU 2-CHOME SHINJUKU-KU TOKYO 163-8003
COMMUNICATIONS RESEARCHINDEPENDENT ADMINISTRATIVE INSTITUTE 4-2-1 NUKUI-KITAMACHI KOGANEI-SHI TOKYO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hamai, Tatsuaki Tokyo, JP 2 17
Kobayashi, Yoshiaki Tokyo, JP 134 1264
Murakami, Kaoru Musashino, JP 18 46
Nakazawa, Isao Kawasaki, JP 39 482
Ogawa, Hiroyo Koganei, JP 16 354
Shimada, Ryoichi Tokyo, JP 3 26
Youkai, Toshikazu Tokyo, JP 2 17

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