Imaging inspection apparatus
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United States of America Patent
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Feb 13, 2007
Grant Date -
Oct 12, 2006
app pub date -
Mar 29, 2005
filing date -
Mar 29, 2005
priority date (Note) -
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Abstract
An imaging inspection apparatus which utilizes a plurality of individual imaging inspection devices (e.g., X-ray Computer Tomography scanning devices) positioned on a frame for directing beams onto articles having objects therein to detect the objects based on established criteria. The apparatus utilizes a conveyor which is not physically coupled to the frame having the imaging inspection devices to pass the articles along a path of travel to an inspection location within the apparatus, whereupon the inspection devices direct beams onto the article and the beams are detected and output signals provided to a processing and analysis assembly which analyzes the signals and identifies certain objects which meet the criteria.
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