Electrical test device
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United States of America Patent
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Jan 16, 2007
Issued Date -
N/A
app pub date -
May 12, 2005
filing date -
May 14, 2004
priority date (Note) -
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Abstract
An electrical test device, in particular for testing wafers, having a contact head, which is associated with the test object and is provided with pin-shaped contact elements that are arrayed to form a contact pin arrangement. An electrical connection apparatus, including contact faces which are in touching contact with ends of the contact elements which face away from the test object. A centering device, which permits only radial play for thermal expansion by sliding guides, for centrally aligning the contact head and the connection apparatus with respect to one another.
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